auriga compact focused ion beam scanning electron microscopy (fib-sem) (Carl Zeiss)
Structured Review
Auriga Compact Focused Ion Beam Scanning Electron Microscopy (Fib Sem), supplied by Carl Zeiss, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/product/auriga+compact+focused+ion+beam+fib+system/beam+focused+ion/10__1016_slash_j__icarus__2024__116448-68-12-11
Average 90 stars, based on 1 article reviews
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